===== LVCMOS 3V3 (HR): Individual runs previous to processing =====

====  About the plots ====

The following are delta-count plots. 
Time goes from top to bottom, and each column corresponds to a (32-bit) error counter (see abscissa labels). A darker blue corresponds to a higher delta-count value. Note that it has enough resolution, just click on it and zoom-in for a detailed view. \\
Color red represents any negative value, and cyan symbolizes any positive value greater than a large threshold. Here, the latter parameter value is configured with the value 100000, a delta-count that can't be reached (according to the max. signal frequency used) in a properly working test. \\
These are mostly CRAM hit patterns, so we should expect the counters running always at the same (1/2 free-running) speed, with variations only corresponding to the variance on the counters values' sampling time (before being sent through serial port to the GUI/log). 

====  EM Noise ====

Note the presence of glitches from run 53 onwards. See [[data_analysis:v7-dynamic:201612-tamu| note here ]]. \\
The amount of red and cyan colored cells in the plot, indicate a "lower bound" for the number of delta-count cells affected by noise.  


====  Bank-wide failure mode ====

In runs: 41, 55, 61 and 62 we see whole-bank outages. \\
Previously, it has been hypothesized that a possible cause for this could be a SEU in a "hidden" configuration bit, suddenly enabling the DCI circuitry (without having onboard the reference resistors for transmission-line termination). 
As this is actually occurring in **HR** IOBs (without associated DCI HW), DCI can not be the cause for bank-wide upsets, at least in this case.


====  Strange features ====

Note that we have anomalous delta-count values of counters, with cells having a //strong blue color// in **run 5** (Counter13), **run 34** (Counter4) and **run 39** (Counter50). 
This corresponds to "case 2" described in the [[data_analysis:v7-dynamic:201703-tamu:iob:hstl| (201703-TAMU) HSTL analysis section ]] ; i.e., having delta error counts larger, in a factor of ~2, than expected (verified in the data files). No other failure mode (in the types described in the mentioned [[data_analysis:v7-dynamic:201703-tamu:iob:hstl| HSTL analysis section]]) was observed in the considered runs, up to test run 51. Unfortunately, from run 53 onwards the dominance of noise glitches prevents us to identify this kind of patterns. 

Note that the affected runs (5, 34, 39) corresponds to **not registered** (combinational) tests (checked both experimenter's spreadsheet and raw data filenames). 


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** The following plot corresponds to test run 5: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun5--previous_to_glitches_filtering.png }}
   
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** The following plot corresponds to test run 6: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun6--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 7: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun7--previous_to_glitches_filtering.png }}
   
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** The following plot corresponds to test run 8: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun8--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 9: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun9--previous_to_glitches_filtering.png }}
   
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** The following plot corresponds to test run 10: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun10--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 34: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun34--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 35: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun35--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 36: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun36--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 37: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun37--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 38: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun38--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 39: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun39--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 40: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun40--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 41: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun41--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 51: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun51--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 53: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun53--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 54: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun54--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 55: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun55--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 56: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun56--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 57: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun57--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 58: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun58--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 59: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun59--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 60: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun60--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 61: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun61--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 62: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun62--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 63: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun63--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 64: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun64--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 65: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun65--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 71: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun71--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 72: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun72--previous_to_glitches_filtering.png }}

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** The following plot corresponds to test run 73: ** \\
{{ data_analysis:v7-dynamic:201612-tamu:iob:lvcmos:testrun73--previous_to_glitches_filtering.png }}



